PMCL
Welcome to Precision Measurement and Control Laboratory!
Building on engineering fundamentals, including design, dynamics, measurement, and control, our goal is to make contributions to the larger engineering and scientific research community by addressing important applications. Major issues involve temporal resolution (1KHz -> 100KHz -> 20MHz), spatial resolution (micrometer -> nanometer -> angstrom), sensitivity, and uncertainty. On-going research has four areas of focus: a) precision engineering and manufacturing metrology, b) visual sensing and visual servo control, c) atomic force microscopy, and d) photonic force microscopy. Application areas include: a) nanomanufacturing and nanometrology, b) control and advanced instrumentation, and c) imaging, force sensing, and manipulation of active biological systems and biomolecules.
News
Recent publications:
- Kim, J. and Menq C. H., 2009, “Visual Servo Control Achieving Nanometer Resolution in X-Y-Z,” IEEE Transactions on Robotics, Vol. 25, No. 1, February 2009, pp. 109-116.
- Zhang, Z. and Menq C. H., 2008, “Three-Dimensional particle tracking with subnanometer resolution using off-focus images,” Applied Optics, Vol. 47, No. 13, pp. 2361-2370, 1 May 2008.
- Hu, K., Kim, J., Schmiedeler, J., and Menq C. H., 2008, “Design, Implementation, and Control of a Six-Axis Compliant Stage”, Review of Scientific Instruments, Vol. 79, 025105 (2008); also published in the March 3, 2008 issue of Virtual Journal of Nanoscale Science & Technology.
- Jayanth, GR., Jhiang, S., and Menq, C. H., 2008, "Two-axis probing system for Atomic Force Microscopy", Review of Scientific Instruments, Vol.